Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Characterization of Guinier-Preston Zones by High-Angle Annular Detector Dark-Field Scanning Transmission Electron Microscopy

Age-hardened alloys are everywhere: in aeroplanes, aluminum sashes, electrical connections for computer devices, and so on. The materials that have made possible the very existence of these human inventions are manufactured based on a single materials-science principle known as ageing. Here, supersaturated impurity atoms that dissolved in an otherwise pure metal gather around inside the metal a...

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this the...

Comparison of phase contrast transmission electron microscopy with optimized scanning transmission annular dark field imaging for protein imaging.

Henderson has already shown that electron microscopy should be superior to X-ray and neutron diffraction for determining protein structure with minimum radiation damage. Since the contrast for a molecule embedded in vitreous ice is very low, it is conceivable that dark field imaging would be superior to bright field phase contrast microscopy. A detailed analysis of contrast and signal/noise for...

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Aberration-corrected scanning transmission electron microscopy (STEM) has become an indispensable tool for characterizing atomic-scale structure in materials and devices. In STEM, a finely focused electron probe is scanned across the specimen and transmitted and/or scattered electrons from a localized material volume are detected by the post specimen detector(s) as a function of raster position...

15. Scanning Transmission Electron Microscopy